Scanning Probe Microscopy (SPM)

Objects of study

The surface of solids with conductivity, including model metal supported catalysts, mainly – on carbon supports.

Applications

• Topography with atomic resolution – for single crystal specimens .
• Particle-size histograms and the localization of the particle at the surface of carbon materials and planar oxide films .

Instrument facilities

1 UHV scanning tunneling microscope (STM) GPI-300 combined with Auger spectrometer. The machine provides:

• the elemental analysis of the surface by Auger spectroscopy;
• residual gases analysis by mass-spectrometer;
• cleaning of the surface by argon etching;
• sample heating up to 1200K.

The best spatial resolution is: lateral – 0.03 nm, vertical – 0.002 nm (for specially prepared samples). The maximal scanning range is 1.2x1.2x1.0 μm³.

2 Ambient conditions scanning multi-microscope SMM2000 providing STM and Contact Mode Atomic Force Microscopy measurements.

The best spatial resolution is: lateral – 0.1 nm, in vertical direction – 0.02 nm (for specially prepared samples). The maximal scanning range is 30x30x2 μm³.

Samples requirements

Electron conductivity of the sample surface for STM regime; the height variation across the scan frame – less than 2 μm.

Leading scientists and their research interests

Prof. V.I. Bukhtiyarov and Dr. R.I. Kvon. Model supported catalysts at carbon supports and planar oxide films.